Part identity
058-005066-001
Microcircuit Memory
Cypress Semiconductor Corporatio
Avg quote: 14 minFulfilled from Anaheim, CAAS9120:2025 · ISO 9001 · FAA AC 00-56BC of C, lot & date code with every line
Part description
Microcircuit Memory
ASAP supports this specific part for replacement, spare-pool replenishment, retrofit, and urgent maintenance requirements. Quote requests can include alternate MPN, condition preferences, certification needs, and plant-specific receiving instructions so procurement gets a clear sourcing response before purchase.
Specifications
Certifications & documentation
- UL Recognized
- CE
- C of C available on request
CS
Manufacturer
Cypress Semiconductor Corporatio
Authorized-distributor or qualified-aftermarket source. Parts shipped from this manufacturer include full traceability paperwork and counterfeit-mitigation per SAE AS6081.
View manufacturer profile →NSN Information for Part Number 058-005066-001 with NSN 5962-01-337-8568, 5962013378568
Characteristics Data of NSN 5962-01-337-8568, 5962013378568
| MRC | Criteria | Characteristic |
|---|---|---|
| ADAQ | BODY LENGTH | 0.442 INCHES MINIMUM AND 0.458 INCHES MAXIMUM |
| ADAT | BODY WIDTH | 0.442 INCHES MINIMUM AND 0.458 INCHES MAXIMUM |
| ADAU | BODY HEIGHT | 0.064 INCHES MINIMUM AND 0.100 INCHES MAXIMUM |
| AEHX | MAXIMUM POWER DISSIPATION RATING | 413.0 MILLIWATTS |
| AFGA | OPERATING TEMP RANGE | -55.0 TO 125.0 DEG CELSIUS |
| AFJQ | STORAGE TEMP RANGE | -65.0 TO 150.0 DEG CELSIUS |
| CBBL | FEATURES PROVIDED | HERMETICALLY SEALED AND BURN IN AND PROGRAMMABLE AND HIGH PERFORMANCE |
| CQSJ | INCLOSURE MATERIAL | CERAMIC |
| CQSZ | INCLOSURE CONFIGURATION | LEADLESS FLAT PACK |
| CQWX | OUTPUT LOGIC FORM | COMPLEMENTARY-METAL OXIDE-SEMICONDUCTOR LOGIC |
| CQZP | INPUT CIRCUIT PATTERN | 14 INPUT |
| CWSG | TERMINAL SURFACE TREATMENT | SOLDER |
| CZEN | VOLTAGE RATING AND TYPE PER CHARACTERISTIC | -0.5 VOLTS MINIMUM POWER SOURCE AND 7.0 VOLTS MAXIMUM POWER SOURCE |
| CZEQ | TIME RATING PER CHACTERISTIC | 50.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME, LOW TO HIGH LEVEL OUTPUT AND 50.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME, HIGH TO LOW LEVEL OUTPUT |
| CZER | MEMORY DEVICE TYPE | PROM |
| TEST | TEST DATA DOCUMENT | 96906-MIL-STD-883 STANDARD (INCLUDES INDUSTRY OR ASSOCIATION STANDARDS, INDIVIDUAL MANUFACTUREER STANDARDS, ETC.). |
| TTQY | TERMINAL TYPE AND QUANTITY | 28 LEADLESS |